CALCULATION OF AN ATOMICALLY MODULATED FRICTION FORCE IN ATOMIC-FORCE MICROSCOPY

被引：172

作者：

TOMANEK, D

ZHONG, W

THOMAS, H

机构：

[1] MICHIGAN STATE UNIV,CTR FUNDAMENTAL MAT RES,E LANSING,MI 48824

[2] UNIV BASEL,INST PHYS,CH-4056 BASEL,SWITZERLAND

来源：

EUROPHYSICS LETTERS | 1991年 / 15卷 / 08期

关键词：

POTENTIAL ENERGY SURFACES FOR CHEMICAL REACTIONS; CALCULATIONS OF TOTAL ELECTRONIC BINDING ENERGY; LAYER STRUCTURES; INTERCALATION COMPOUNDS AND SUPERLATTICES; GROWTH; STRUCTURE AND NONELECTRONIC PROPERTIES; ELECTRON MICROSCOPY DETERMINATIONS (INC SCANNING TUNNELING MICROSCOPY METHODS);

D O I：

10.1209/0295-5075/15/8/014

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We investigate the microscopic mechanism of energy dissipation in the friction force microscope (FFM), which is a modification of the atomic-force microscope for application to friction. Based on ab initio results for the interaction between Pd and graphite, we determine the atomic-scale modulation of the friction force and the corresponding stick-slip motion at the interface during the relative motion between these solids. We propose two idealized versions of the FFM and show that the friction force depends not only on the Pd-graphite interaction potential, but even more critically on the construction parameters of such a microscope.

引用

页码：887 / 892

页数：6

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