SCALING OF THE (SQUARE-ROOT-3XSQUARE-ROOT-3) R30-DEGREES DOMAIN-SIZE DISTRIBUTION WITH COVERAGE FOR AG/SI(111)

The evolution of the (square-root 3 X square-root 3)R30-degrees domain-size distribution with coverage for Ag on Si(111) has been studied by high-resolution low-energy electron diffraction. Scaling of the size distribution, which can be fitted by a gamma distribution, is observed. A temperature dependence of the exponent n describing a power growth law for mean size versus coverage is found where n decreases with decreasing deposition temperature. By introducing a simple relation, q + nd = 1, where the dimensionality d = 2 and q is an exponent describing the power law for domain density versus coverage, the behavior of n is explained in terms of the experimentally observed behavior of q.