VECTOR ORDER PARAMETER FOR AN UNPOLARIZED LASER AND ITS VECTORIAL TOPOLOGICAL DEFECTS

被引:64
作者
GIL, L
机构
[1] Institut du Non-Lineaire de Nice, Université de Nice Sophia-Antipolis, Parc Valrose
关键词
D O I
10.1103/PhysRevLett.70.162
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We consider the full set of equations ruling the interaction of an electromagnetic field with matter in a laser, without assuming that the direction of the transverse electric field is fixed. Near the lasing threshold, we reduce the dynamics to its normal form equation, and show that the electromagnetic field can be described by a Ginzburg-Landau equation in a vector form. Then by using topological arguments we show the possibility of vectorial topological defects which are not predictable by the scalar theory.
引用
收藏
页码:162 / 165
页数:4
相关论文
共 30 条
[1]   VORTICES AND DEFECT STATISTICS IN 2-DIMENSIONAL OPTICAL CHAOS [J].
ARECCHI, FT ;
GIACOMELLI, G ;
RAMAZZA, PL ;
RESIDORI, S .
PHYSICAL REVIEW LETTERS, 1991, 67 (27) :3749-3752
[2]   DISINTEGRATION OF WAVE TRAINS ON DEEP WATER .1. THEORY [J].
BENJAMIN, TB ;
FEIR, JE .
JOURNAL OF FLUID MECHANICS, 1967, 27 :417-&
[3]  
BERRY M, 1980, PHYSICS DEFECTS, P456
[4]   TRANSVERSE LASER PATTERNS .1. PHASE SINGULARITY CRYSTALS [J].
BRAMBILLA, M ;
BATTIPEDE, F ;
LUGIATO, LA ;
PENNA, V ;
PRATI, F ;
TAMM, C ;
WEISS, CO .
PHYSICAL REVIEW A, 1991, 43 (09) :5090-5113
[5]   OPTICAL VORTICES [J].
COULLET, P ;
GIL, L ;
ROCCA, F .
OPTICS COMMUNICATIONS, 1989, 73 (05) :403-408
[6]   STABILITY ANALYSIS OF NONLINEAR COHERENT COUPLING [J].
DAINO, B ;
GREGORI, G ;
WABNITZ, S .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (12) :4512-4514
[7]   GAUSS-LAGUERRE MODES - A SENSIBLE BASIS FOR LASER DYNAMICS [J].
DALESSANDRO, G ;
OPPO, GL .
OPTICS COMMUNICATIONS, 1992, 88 (2-3) :130-136
[8]  
Gourlay A. R., 1970, Journal of the Institute of Mathematics and Its Applications, V6, P375
[9]  
Haken H., 1977, SYNERGETICS
[10]   COMPARISON OF QUANTUM AND SEMICLASSICAL RADIATION THEORIES WITH APPLICATION TO BEAM MASER [J].
JAYNES, ET ;
CUMMINGS, FW .
PROCEEDINGS OF THE IEEE, 1963, 51 (01) :89-+