DIFFRACTION PATTERNS OF AL-CU-CO-(SI) - MICROCRYSTALLINE OR QUASI-CRYSTALLINE PHASES

被引：7

作者：

FETTWEIS, M ^{[1
]}

LAUNOIS, P ^{[1
]}

DENOYER, F ^{[1
]}

REICH, R ^{[1
]}

GODARD, JM ^{[1
]}

LAMBERT, M ^{[1
]}

机构：

[1] CENS,CEA,LAB LEON BRILLOUIN,CNRS,F-91191 GIF SUR YVETTE,FRANCE

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1993年 / 153卷

关键词：

D O I：

10.1016/0022-3093(93)90307-J

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

High resolution X-ray diffraction data from measurements on a (decagonal) single crystal of nominal composition Al63Cu17.5Co17.5Si2 are presented. Their analysis is strongly in favour of a microcrystalline model. Within this model, the sample is formed of crystalline domains having 72-degrees orientational relationships, each domain being tilted with rhombs of edge r0 = 51.515 angstrom and with a 72-degrees angle. The problem of the domain arrangement is discussed.

引用

页码：24 / 27

页数：4

共 26 条

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