A CONFIGURABLE ANGLE-RESOLVING DETECTOR SYSTEM IN STEM

被引：15

作者：

DABERKOW, I ^{[1
]}

HERRMANN, KH ^{[1
]}

LENZ, F ^{[1
]}

机构：

[1] UNIV TUBINGEN,INST APPL PHYS,W-7400 TUBINGEN 1,GERMANY

来源：

ULTRAMICROSCOPY | 1993年 / 50卷 / 01期

关键词：

D O I：

10.1016/0304-3991(93)90092-C

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A configurable angle-resolving detector system for a STEM has been developed, which opens a universal and flexible way of masking the diffraction pattern. The diffraction pattern can be divided in up to 16 areas of arbitrary shapes which may be defined analytically, or be constructed interactively under observation of the diffraction pattern. The signals from such areas are separately accumulated and processed. A simple demonstration is shown for two MgO crystals with different orientation. The special case of differential phase contrast is demonstrated for a hole in an amorphous carbon film.

引用

页码：75 / 82

页数：8

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