ANALYSIS OF RESISTANCE FLUCTUATIONS INDEPENDENT OF THERMAL VOLTAGE NOISE

[1] APPLICATION OF THE CURRENT NOISE TECHNIQUE TO THE INVESTIGATION ON DISLOCATIONS IN METALS DURING PLASTIC-DEFORMATION [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) : 6948 - 6955

[2] STUDY OF DISLOCATION DYNAMICS IN METALS THROUGH CURRENT NOISE MEASUREMENTS [J]. SCRIPTA METALLURGICA, 1978, 12 (10): : 943 - 948

[3] BITTEL H, 1974, APPL PHYS, V5, P283, DOI 10.1007/BF00928142

[4] EXCESS NOISE IN SEMICONDUCTING DEVICES DUE TO FLUCTUATIONS IN THEIR CHARACTERISTICS WHEN SIGNALS ARE APPLIED [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (07): : 883 - &

[5] THERMAL-EQUILIBRIUM PROPERTIES OF VACANCIES IN METALS THROUGH CURRENT-NOISE MEASUREMENTS [J]. PHYSICAL REVIEW LETTERS, 1976, 36 (01) : 38 - 42

[6] LORTEIJE JH, 1971, PHILIPS RES REP, V26, P29

[7] VENKATARAMAN G, 1979, MATER SCI B, V1, P59

[8] VENKATARAMAN G, 1978, NOV BAN HIND U

[9] WOLF D, 1978, NOISE PHYSICAL SYSTE, V2

[1] APPLICATION OF THE CURRENT NOISE TECHNIQUE TO THE INVESTIGATION ON DISLOCATIONS IN METALS DURING PLASTIC-DEFORMATION [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) : 6948 - 6955

[2] STUDY OF DISLOCATION DYNAMICS IN METALS THROUGH CURRENT NOISE MEASUREMENTS [J]. SCRIPTA METALLURGICA, 1978, 12 (10): : 943 - 948

[3] BITTEL H, 1974, APPL PHYS, V5, P283, DOI 10.1007/BF00928142

[4] EXCESS NOISE IN SEMICONDUCTING DEVICES DUE TO FLUCTUATIONS IN THEIR CHARACTERISTICS WHEN SIGNALS ARE APPLIED [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (07): : 883 - &

[5] THERMAL-EQUILIBRIUM PROPERTIES OF VACANCIES IN METALS THROUGH CURRENT-NOISE MEASUREMENTS [J]. PHYSICAL REVIEW LETTERS, 1976, 36 (01) : 38 - 42

[6] LORTEIJE JH, 1971, PHILIPS RES REP, V26, P29

[7] VENKATARAMAN G, 1979, MATER SCI B, V1, P59

[8] VENKATARAMAN G, 1978, NOV BAN HIND U

[9] WOLF D, 1978, NOISE PHYSICAL SYSTE, V2