ELECTROCHEMICAL MODULATION SPECTROSCOPY

[1] BENKEN WV, 1970, ANAL CHEM, V42, P1114

[2] BEWICK A, 1972, 141 NAT M EL SOC HOU

[3] SPECTROELECTROCHEMICAL MEASUREMENTS OF SECOND-ORDER CATALYTIC REACTION RATES USING SIGNAL AVERAGING [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1970, 74 (17) : 3231 - &

[4] BOCKRIS JO, 1970, MODERN ELECTROCHEMIS, pCH9

[5] BOCKRIS JO, 1970, MODERN ELECTROCHEMIS, pCH8

[6] MODULATION ELLIPSOMETRY AND ITS APPLICATION TO STUDY OF ELECTRODE-ELECTROLYTE INTERFACE [J]. SURFACE SCIENCE, 1973, 37 (01) : 559 - 567

[7] Cardona M., 1969, MODULATION SPECTROSC

[8] Delahay P., 1954, NEW INSTRUMENTAL MET

[9] Delahay P., 1965, DOUBLE LAYER ELECTRO

[10] INFLUENCE OF SURFACE-ROUGHNESS ON TRANSMISSION AND REFLECTANCE SPECTRA OF ADSORBED SPECIES [J]. JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS II, 1973, 69 (01): : 65 - 78

[1] BENKEN WV, 1970, ANAL CHEM, V42, P1114

[2] BEWICK A, 1972, 141 NAT M EL SOC HOU

[3] SPECTROELECTROCHEMICAL MEASUREMENTS OF SECOND-ORDER CATALYTIC REACTION RATES USING SIGNAL AVERAGING [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1970, 74 (17) : 3231 - &

[4] BOCKRIS JO, 1970, MODERN ELECTROCHEMIS, pCH9

[5] BOCKRIS JO, 1970, MODERN ELECTROCHEMIS, pCH8

[6] MODULATION ELLIPSOMETRY AND ITS APPLICATION TO STUDY OF ELECTRODE-ELECTROLYTE INTERFACE [J]. SURFACE SCIENCE, 1973, 37 (01) : 559 - 567

[7] Cardona M., 1969, MODULATION SPECTROSC

[8] Delahay P., 1954, NEW INSTRUMENTAL MET

[9] Delahay P., 1965, DOUBLE LAYER ELECTRO

[10] INFLUENCE OF SURFACE-ROUGHNESS ON TRANSMISSION AND REFLECTANCE SPECTRA OF ADSORBED SPECIES [J]. JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS II, 1973, 69 (01): : 65 - 78