DEVELOPMENT OF A PH-SENSITIVE ISFET SUITABLE FOR FABRICATION IN A VOLUME PRODUCTION ENVIRONMENT

被引:8
作者
GARDE, A
ALDERMAN, J
LANE, W
机构
[1] National Microelectronics Research Centre, University College, Cork
关键词
ISFET; PH-SENSITIVITY;
D O I
10.1016/0925-4005(94)01614-N
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Silicon nitride (Si3N4) is used extensively as the pH-sensitive surface in ion-sensitive field-effect transistors (ISFETs). However, in order for it to exhibit a Nernstian pH response, a treatment in hydrofluoric acid (HF) is often required immediately prior to use. This article describes a method of increasing the pH sensitivity of Si3N4 by using rapid thermal processing (RTP) techniques. Our investigations show that this is a very controlled method of surface modification. It does not interfere with standard processing techniques and most importantly it eliminates the need for a HF treatment. Thus, it is concluded that RTP of Si3N4 is very suitable for use in a volume production environment and is potentially an effective method of controlling the Si3N4 surface in ISFETs.
引用
收藏
页码:341 / 344
页数:4
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