CHARACTERIZATION OF A DIRECT SAMPLE INSERTION DEVICE FOR INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION-SPECTROMETRY

被引:30
作者
KARANASSIOS, V [1 ]
HORLICK, G [1 ]
ABDULLAH, M [1 ]
机构
[1] UNIV ALBERTA,DEPT CHEM,EDMONTON T6G 2G2,ALBERTA,CANADA
关键词
D O I
10.1016/0584-8547(90)80082-T
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
A direct sample insertion device allows insertion of sample carrying probes into an inductively coupled plasma discharge. In this study, analyte emission temporal behavior for such a device was surveyed for several elements with a range of vaporization properties. The emission time behavior for most elements was characterized as a function of probe geometry, composition, insertion speed and insertion position as well as applied plasma power. A long undercut graphite electrode was found to be the best shape for all probe geometries tested. Furthermore, it was demonstrated that the sample carrying probe should be inserted rapidly to a position corresponding to the top of the load coil and the plasma power should be high (1.75-2.00 kW) in order to attain best analytical performance. © 1990.
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页码:105 / 118
页数:14
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