LONG-RANGE ELECTRONIC PERTURBATIONS CAUSED BY DEFECTS USING SCANNING TUNNELING MICROSCOPY

被引：252

作者：

MIZES, HA ^{[1
]}

FOSTER, JS ^{[1
]}

机构：

[1] IBM CORP,DIV RES,ALMADEN RES CTR,SAN JOSE,CA 95120

来源：

SCIENCE | 1989年 / 244卷 / 4904期

关键词：

D O I：

10.1126/science.244.4904.559

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：559 / 562

页数：4

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