INFLUENCE OF CARRIER-FREE SURFACE-LAYERS ON INFRARED REFLECTANCE SPECTRA OF N-TYPE METALLIC OXIDES

被引：5

作者：

COX, PA

EGDELL, RG

FLAVELL, WR

KEMP, JP

POTTER, FH

RASTOMJEE, CS

机构：

[1] UNIV LONDON IMPERIAL COLL SCI & TECHNOL, DEPT CHEM, LONDON SW7 2AZ, ENGLAND

[2] UNIV MANCHESTER, INST SCI & TECHNOL, DEPT CHEM, MANCHESTER M60 1QD, LANCS, ENGLAND

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1990年 / 54卷

关键词：

D O I：

10.1016/0368-2048(90)80307-V

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The influence of carrier-free surface layers on infrared reflection spectra of metallic oxides has been explored using model calculations on two-layer systems. Reflectivity minima are found at LO phonon frequencies. Comparison is made with preliminary experimental data from Sb-doped SnO2 ceramics and Na0.6WO3 single crystal surfaces oxidised in air at 500-degrees-C.

引用

收藏

页码：1173 / 1182

页数：10

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