XPS AND ESR OF SNSE2-1-PERCENT-P(COCP2)0.36

被引:6
作者
CLEARY, DA [1 ]
BAER, DR [1 ]
机构
[1] PACIFIC NW LAB, MOLEC SCI RES CTR, RICHLAND, WA 99352 USA
关键词
D O I
10.1021/cm00019a024
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have measured the Co 2P3/2 X-ray photoelectron (XPS) spectrum of SnSe2-1%P{CoCp2}0.36 as a function of time and have found that the Co 2p3/2 profile changes with time. This indicates that SnSe2-1%P{CoCP2}0.36 undergoes radiation damage as a result of X-ray exposure. Consideration of this damage is important when attempting to use XPS as a measure of the Co2+/Co3+ ratio is this material. Our X-band ESR spectra of SnSe2-1%P{CoCP2}0.36 are consistent with the presence of neutral cobaltocene in this material. Quantitative agreement between the XPS and ESR results is achieved when the temporal change in the XPS line shape is modeled using second-order kinetics.
引用
收藏
页码:112 / 116
页数:5
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