WAVELENGTH-MODULATING SPECTROMETER IMPLEMENTED WITH PHOTO-VOLTAIC PHOTO-DIODES

被引：4

作者：

LUE, JT

机构：

[1] Department of Physics, National Tsing Hua University, Hsinchu

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1979年 / 12卷 / 09期

关键词：

D O I：

10.1088/0022-3735/12/9/012

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The spectrometer described is used for studying the optical properties of semiconductors. A servo-system for automatic control of the gain of the reference preamplifier and a phase detector for detecting the DC component of the light source are employed.

引用

页码：833 / 836

页数：4

共 8 条

[1]

BATZ B, 1972, SEMICONDUCT SEMIMET, V9, P316

[2] BAND-POPULATION INTERFERENCE PHENOMENA IN ELECTROREFLECTANCE OF NARROW-GAP SEMICONDUCTORS UNDER HEAVY SURFACE ACCUMULATION [J].