SHEAR PROPERTIES OF POLARIZED PVF2 FILM STUDIED BY THE PIEZOELECTRIC RESONANCE METHOD

Observations have been made of thickness shear resonances in commercially available stretched and poled PVF2 film. The resonances were observed by direct coupling through the piezoelectric properties of the film, using an electrode configuration that applies the rf electric field in the plane of the film. Observations were made from ambient temperature to liquid-helium temperature and values of resonant frequencies, piezoelectric coupling constants, and mechanical quality factors were deduced from input-impedance-vs- frequency curves for thickness shear resonances with vibration polarized parallel and perpendicular to the stretch direction.