SMALL-ANGLE X-RAY-SCATTERING STUDY OF FLUCTUATIONS IN 1-PROPANOL WATER AND 2-PROPANOL WATER-SYSTEMS

被引:129
作者
HAYASHI, H [1 ]
NISHIKAWA, K [1 ]
IIJIMA, T [1 ]
机构
[1] GAKUSHUIN UNIV,FAC SCI,DEPT CHEM,TOSHIMA KU,TOKYO 171,JAPAN
关键词
D O I
10.1021/j100384a062
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Small-angle X-ray scattering (SAXS) measurements have been carried out on the 1-propanol (NPA)-water system and on the 2-propanol (IPA)-water system at 20°C. In the NPA-water system, the zero angle intensity, the concentration fluctuation, the Kirkwood-Buff parameters, and Debye's correlation lengths have been determined at various concentrations. In the IPA-water system, the zero angle intensity and Debye's correlation lengths have also been determined. In both the NPA-water and IPA-water systems, all obtained parameters have maxima at about 0.2 of the mole fraction of alcohol. In terms of these parameters, the mixing state of the NPA-water and IPA-water systems is discussed and compared with that of the TBA-water system. © 1990 American Chemical Society.
引用
收藏
页码:8334 / 8338
页数:5
相关论文
共 20 条
[2]   THERMODYNAMICS OF AQUEOUS MIXTURES OF NON-ELECTROLYTES .2. ISOBARIC HEAT-CAPACITIES OF WATER-N-ALCOHOL MIXTURES AT 25-DEGREES-C [J].
BENSON, GC ;
DARCY, PJ ;
KIYOHARA, O .
JOURNAL OF SOLUTION CHEMISTRY, 1980, 9 (12) :931-938
[3]   THERMODYNAMICS OF AQUEOUS MIXTURES OF NON-ELECTROLYTES .1. EXCESS VOLUMES OF WATER-N-ALCOHOL MIXTURES AT SEVERAL TEMPERATURES [J].
BENSON, GC ;
KIYOHARA, O .
JOURNAL OF SOLUTION CHEMISTRY, 1980, 9 (10) :791-804
[4]   Structural aspects of the electrical resistivity of binary alloys [J].
Bhatia, A. B. ;
Thornton, D. E. .
PHYSICAL REVIEW B-SOLID STATE, 1970, 2 (08) :3004-3012
[5]  
Davidson D. W., 1973, WATER COMPREHENSIVE, V2
[6]   ANGULAR DISSYMMETRY OF THE CRITICAL OPALESCENCE IN LIQUID MIXTURES [J].
DEBYE, P .
JOURNAL OF CHEMICAL PHYSICS, 1959, 31 (03) :680-687
[7]  
Glew D.M., 1968, HYDROGEN BONDED SOLV, P159
[8]   FORMATION OF CLUSTERS IN 1-PROPANOL-WATER-MIXTURES [J].
GROSSMANN, GH ;
EBERT, KH .
BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1981, 85 (11) :1026-1029
[9]   CONSTRUCTION OF A SMALL-ANGLE X-RAY-SCATTERING DIFFRACTOMETER FOR THE STUDY OF FLUCTUATIONS IN SOLUTIONS [J].
HAYASHI, H ;
NISHIKAWA, K ;
IIJIMA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (08) :1501-1503
[10]   EASY DERIVATION OF THE FORMULA RELATING THE FLUCTUATIONS OF A BINARY-SYSTEM TO THE X-RAY-SCATTERING INTENSITY EXTRAPOLATED TO S = O [J].
HAYASHI, H ;
NISHIKAWA, K ;
IIJIMA, T .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1990, 23 :134-135