INTENSITY CHANGES OF FLUORESCENCE FROM A NAI (TL) CRYSTAL DURING DYNAMICAL DIFFRACTION PROCESS

被引：1

作者：

ANNAKA, S

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1972年 / 11卷 / 08期

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D O I：

10.1143/JJAP.11.1214

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1214 / &

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[1] INTENSITY ANOMALY OF FLUORESCENT X-RAY EMISSION ACCOMPANYING LAUE CASE REFLECTION FROM A PERFECT CRYSTAL
ANNAKA, S
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1967, 23 (02) : 372 - &
[2] INTENSITY ANOMALY OF X-RAY COMPTON AND THERMAL SCATTERINGS ACCOMPANYING BRAGG REFLECTIONS FROM PERFECT SI AND GE CRYSTALS
ANNAKA, S
KIKUTA, S
KOHRA, K
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1966, 21 (08) : 1559 - &
[3] DIRECTION DEPENDENCE OF INTENSITY ANOMALY OF X-RAY THERMAL SCATTERING ACCOMPANYING BRAGG CASE REFLECTION
ANNAKA, S
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1968, 24 (06) : 1332 - &
[4] EFFECT OF DYNAMICAL DIFFRACTION IN X-RAY FLUORESCENCE SCATTERING
BATTERMAN, BW
[J]. PHYSICAL REVIEW A-GENERAL PHYSICS, 1964, 133 (3A): : A759 - &