NEW CRITERION FOR TESTING ANALOG-TO-DIGITAL CONVERTERS FOR STATISTICAL EVALUATION

被引：3

作者：

KOLLER, HU ^{[1
]}

机构：

[1] SWISS FED INST TECHNOL,ZURICH,SWITZERLAND

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1973年 / IM22卷 / 03期

关键词：

D O I：

10.1109/TIM.1973.4314150

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：214 / 217

页数：4

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