DETECTION AND IDENTIFICATION OF MICROPARTICLES OCCURRING IN A HIGH-VOLTAGE VACUUM-INSULATED GAP USING ELECTRON-OPTICAL METHODS

被引：12

作者：

MENON, MM ^{[1
]}

SRIVASTA.KD ^{[1
]}

机构：

[1] UNIV WATERLOO, DEPT ELECT ENGN, WATERLOO, ONTARIO, CANADA

来源：

JOURNAL OF APPLIED PHYSICS | 1974年 / 45卷 / 05期

关键词：

D O I：

10.1063/1.1663550

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

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页码：2094 / 2098

页数：5

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