SIGNAL-TO-NOISE IN SILICON MICROSTRIP DETECTORS WITH BINARY READOUT

被引:14
作者
DEWITT, J
DORFAN, D
DUBBS, T
GRILLO, A
HUBBARD, B
KASHIGIN, S
NOBLE, K
PULLIAM, T
RAHN, J
ROWE, WA
SADROZINSKI, HFW
SEIDEN, A
SPENCER, E
WEBSTER, A
WILDER, M
WILLIAMS, DC
CIOCIO, A
COLLINS, T
KIPNIS, I
SPIELER, H
IWASAKI, H
KOHRIKI, T
KONDO, T
TERADA, S
UNNO, Y
IWATA, Y
OHMOTO, T
OHSUGI, T
YOSHIKAWA, M
TAKASHIMA, R
MAEOHMICHI, H
TAKAHATA, M
TAMURA, N
机构
[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,BERKELEY,CA
[2] NATL LAB HIGH ENERGY PHYS,KEK,TSUKUBA,IBARAKI 305,JAPAN
[3] HIROSHIMA UNIV,HIROSHIMA,JAPAN
[4] KYOTO UNIV,KYOTO,JAPAN
[5] OKAYAMA UNIV,OKAYAMA 700,JAPAN
关键词
D O I
10.1109/23.467803
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the results of a beam test at KEK using double-sided AC-coupled silicon microstrip detectors with binary readout, i.e., a readout where the signals are discriminated in the front-end electronics and only the hit location as kept. For strip pitch between 50 mu and 200 mu, we determine the efficiency and the noise background as function of threshold setting. This allows us to reconstruct the Landau pulse height spectrum and determine the signal/noise ratio. In addition, the threshold/noise ratio necessary for operation with low occupancy is determined.
引用
收藏
页码:445 / 450
页数:6
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