RESONANT RAMAN-SCATTERING IN AS2S3 AMORPHOUS THIN-FILMS

被引:4
作者
RAZZETTI, C [1 ]
LOTTICI, PP [1 ]
机构
[1] CNR,NAZL STRUTTURA MAT GRP,PARMA,ITALY
来源
PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1978年 / 87卷 / 02期
关键词
D O I
10.1002/pssb.2220870209
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The RRS cross‐section and the optical constants are investigated in amorphous As2S3 thin films. The results indicate that the cross‐section relative to the 350 cm−1 band is simply related to the imaginary (dissipative, or resonant) part of the dielectric susceptibility. Also an enhancement is found of the width of the 350 cm−1 band, which seems to diverge with increasing exciting energy. An absorption–emission picture of the RRS process could account for the observed results. Copyright © 1978 WILEY‐VCH Verlag GmbH & Co. KGaA
引用
收藏
页码:479 / 483
页数:5
相关论文
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