REEXAMINATION OF THE SURFACE-PLASMA-WAVE TECHNIQUE FOR DETERMINING THE DIELECTRIC-CONSTANT AND THICKNESS OF METAL-FILMS

被引：26

作者：

ROBERTSON, WM ^{[1
]}

FULLERTON, E ^{[1
]}

机构：

[1] UNIV CALIF SAN DIEGO, DEPT PHYS, LA JOLLA, CA 92093 USA

来源：

关键词：

D O I：

10.1364/JOSAB.6.001584

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1584 / 1589

页数：6

共 14 条

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