REGULATION OF A MICROCANTILEVER RESPONSE BY FORCE FEEDBACK

被引:222
作者
MERTZ, J
MARTI, O
MLYNEK, J
机构
[1] Fakultät für Physik, Universität Kanstanz
关键词
D O I
10.1063/1.109413
中图分类号
O59 [应用物理学];
学科分类号
摘要
A feedback mechanism is used to control the forces incident on a mechanical microcantilever as a function of the monitored cantilever motion. The control is effected by modifying the intensity of an auxiliary laser beam that generates a thermally induced stress. The feedback is designed to reduce the effective resonance quality factor of the cantilever. The resultant regulation of the cantilever motion is shown to improve the measurement dynamics in atomic force microscopy, without significantly degrading the signal to noise ratio.
引用
收藏
页码:2344 / 2346
页数:3
相关论文
共 14 条
[1]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[2]   AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER [J].
ALEXANDER, S ;
HELLEMANS, L ;
MARTI, O ;
SCHNEIR, J ;
ELINGS, V ;
HANSMA, PK ;
LONGMIRE, M ;
GURLEY, J .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :164-167
[3]   LASER THERMAL EFFECTS ON ATOMIC FORCE MICROSCOPE CANTILEVERS [J].
ALLEGRINI, M ;
ASCOLI, C ;
BASCHIERI, P ;
DINELLI, F ;
FREDIANI, C ;
LIO, A ;
MARIANI, T .
ULTRAMICROSCOPY, 1992, 42 :371-378
[4]  
BINING G, 1986, PHYS REV LETT, V56, P930
[5]   INTERACTION FORCE DETECTION IN SCANNING PROBE MICROSCOPY - METHODS AND APPLICATIONS [J].
DURIG, U ;
ZUGER, O ;
STALDER, A .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (05) :1778-1798
[6]   MECHANICAL AND THERMAL EFFECTS OF LASER IRRADIATION ON FORCE MICROSCOPE CANTILEVERS [J].
MARTI, O ;
RUF, A ;
HIPP, M ;
BIELEFELDT, H ;
COLCHERO, J ;
MLYNEK, J .
ULTRAMICROSCOPY, 1992, 42 :345-350
[7]   ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE [J].
MARTIN, Y ;
WILLIAMS, CC ;
WICKRAMASINGHE, HK .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) :4723-4729
[8]   CORRECTION [J].
MEYER, G .
APPLIED PHYSICS LETTERS, 1988, 53 (24) :2400-2400
[9]   FORCE MICROSCOPY WITH A BIDIRECTIONAL CAPACITANCE SENSOR [J].
NEUBAUER, G ;
COHEN, SR ;
MCCLELLAND, GM ;
HORNE, D ;
MATE, CM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (09) :2296-2308
[10]   MAGNETIC FORCE MICROSCOPY - GENERAL-PRINCIPLES AND APPLICATION TO LONGITUDINAL RECORDING MEDIA [J].
RUGAR, D ;
MAMIN, HJ ;
GUETHNER, P ;
LAMBERT, SE ;
STERN, JE ;
MCFADYEN, I ;
YOGI, T .
JOURNAL OF APPLIED PHYSICS, 1990, 68 (03) :1169-1183