INFLUENCE OF THE ELECTRONIC STOPPING POWER ON THE DAMAGE RATE OF YTTRIUM-IRON GARNETS IRRADIATED BY HIGH-ENERGY HEAVY-IONS

被引：62

作者：

FUCHS, G

STUDER, F

BALANZAT, E

GROULT, D

TOULEMONDE, M

JOUSSET, JC

机构：

[1] CNRS, CEA, CTR INTERDISCIPLINAIRE RECH IONS LOURDS, COMMUN LAB, F-14040 CAEN, FRANCE

[2] LAB CRISTALLOG CHIM & PHYS SOLIDE, UA 251, F-14032 CAEN, FRANCE

来源：

EUROPHYSICS LETTERS | 1987年 / 3卷 / 03期

关键词：

ION BEAMS - MICROSCOPIC EXAMINATION - Transmission Electron Microscopy - YTTRIUM COMPOUNDS - Electronic Properties;

D O I：

10.1209/0295-5075/3/3/012

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Heavy-ion irradiation in the Gev range is an excellent way to investigate electronic stopping power effects in solids up to a few kev/A. Effects of 1. 8 Gev Ar, 2. 9 Gev Kr and 3. 0 Gev Xe irradiations of yttrium-iron garnets have been investigated by magnetic measurements and transmission electronic microscopy (TEM). The dominant effect of electronic losses is demonstrated. For the first time, TEM images of latent tracks are presented.

引用

页码：321 / 326

页数：6

共 12 条

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