TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF POLYMER MATERIALS

被引：72

作者：

VANLEYEN, D ^{[1
]}

HAGENHOFF, B ^{[1
]}

NIEHUIS, E ^{[1
]}

BENNINGHOVEN, A ^{[1
]}

BLETSS, IV ^{[1
]}

HERCULES, DM ^{[1
]}

机构：

[1] UNIV PITTSBURGH,PITTSBURGH,PA 15260

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 03期

关键词：

D O I：

10.1116/1.576047

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1790 / 1794

页数：5

共 12 条

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[2] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF NYLONS - DETECTION OF HIGH MASS FRAGMENTS [J].

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[4]

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[6]

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[7] STATIC SECONDARY ION MASS-SPECTROMETRY ANALYSIS OF POLYCARBONATE SURFACES - EFFECT OF STRUCTURE AND OF SURFACE MODIFICATION ON THE SPECTRA [J].

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[8] TOF-SIMS ANALYSIS OF THE SURFACE OF INSULATORS - EXAMPLES OF CHEMICALLY MODIFIED POLYMERS AND GLASS [J].

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[9]

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[10]

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