TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF POLYMER MATERIALS

被引:72
作者
VANLEYEN, D [1 ]
HAGENHOFF, B [1 ]
NIEHUIS, E [1 ]
BENNINGHOVEN, A [1 ]
BLETSS, IV [1 ]
HERCULES, DM [1 ]
机构
[1] UNIV PITTSBURGH,PITTSBURGH,PA 15260
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 03期
关键词
D O I
10.1116/1.576047
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:1790 / 1794
页数:5
相关论文
共 12 条
[11]  
LUB J, UNPUB ORG MASS SPECT
[12]   A TIME-OF-FLIGHT MASS-SPECTROMETER FOR STATIC SIMS APPLICATIONS [J].
STEFFENS, P ;
NIEHUIS, E ;
FRIESE, T ;
GREIFENDORF, D ;
BENNINGHOVEN, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03) :1322-1325