ANALYSIS OF FIELD-ION MICROGRAPHS - STACKING FAULTS IN TUNGSTEN

被引:29
作者
SMITH, DA
BOWKETT, KM
机构
来源
PHILOSOPHICAL MAGAZINE | 1968年 / 18卷 / 156期
关键词
D O I
10.1080/14786436808227752
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:1219 / &
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