LASER-INDUCED ANISOTROPIC THERMOELECTRIC VOLTAGES IN THIN-FILMS

[1] MECHANISMS OF STRESS RELIEF IN POLYCRYSTALLINE FILMS [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1969, 13 (02) : 197 - +

[2] CHOPRA KL, 1969, THIN FILM PHENOMENA, pCH5

[3] CUOMO JJ, PRIVATE COMMUNICATIO

[4] Feinleib J., 1972, J NONCRYSTALLINE SOL, V8, P909, DOI [10.1016/0022-3093(72)90246-3, DOI 10.1016/0022-3093(72)90246-3]

[5] GUTFELD RJV, 1972, J APPL PHYS, V43, P4688

[6] GUTFELD RJV, 1970, OPTOELECTRONICS, V2, P215

[7] INTRINSIC STRESS IN EVAPORATED METAL FILMS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (08) : 823 - &

[8] LANKARD JR, 1969, IEEE J QUANTUM ELECT, VQE 5, P625

[9] MICROMACHINING AND IMAGE RECORDING ON THIN FILMS BY LASER BEAMS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1971, 50 (06): : 1761 - +

[10] MEYER JA, 1970, APPL PHYS LETTERS, V16, P3

[1] MECHANISMS OF STRESS RELIEF IN POLYCRYSTALLINE FILMS [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1969, 13 (02) : 197 - +

[2] CHOPRA KL, 1969, THIN FILM PHENOMENA, pCH5

[3] CUOMO JJ, PRIVATE COMMUNICATIO

[4] Feinleib J., 1972, J NONCRYSTALLINE SOL, V8, P909, DOI [10.1016/0022-3093(72)90246-3, DOI 10.1016/0022-3093(72)90246-3]

[5] GUTFELD RJV, 1972, J APPL PHYS, V43, P4688

[6] GUTFELD RJV, 1970, OPTOELECTRONICS, V2, P215

[7] INTRINSIC STRESS IN EVAPORATED METAL FILMS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (08) : 823 - &

[8] LANKARD JR, 1969, IEEE J QUANTUM ELECT, VQE 5, P625

[9] MICROMACHINING AND IMAGE RECORDING ON THIN FILMS BY LASER BEAMS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1971, 50 (06): : 1761 - +

[10] MEYER JA, 1970, APPL PHYS LETTERS, V16, P3