POSSIBLE ELECTRICAL DOUBLE-LAYER CONTRIBUTION TO THE EQUILIBRIUM THICKNESS OF INTERGRANULAR GLASS-FILMS IN POLYCRYSTALLINE CERAMICS

被引:152
作者
CLARKE, DR
SHAW, TM
PHILIPSE, AP
HORN, RG
机构
[1] IBM CORP,DIV RES,T J WATSON RES CTR,YORKTOWN HTS,NY 10598
[2] UNIV UTRECHT,VANT HOFT LAB,3508 TB UTRECHT,NETHERLANDS
[3] UNIV S AUSTRALIA,SCH APPL PHYS,THE LEVELS,SA 5095,AUSTRALIA
[4] UNIV S AUSTRALIA,SCH CHEM TECHNOL,THE LEVELS,SA 5095,AUSTRALIA
关键词
D O I
10.1111/j.1151-2916.1993.tb03741.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The plausibility of the entropic repulsion of electrical double layers acting to stabilize an equilibrium thickness of intergranular glass films in polycrystalline ceramics is explored. Estimates of the screening length, surface potential, and surface charge required to provide a repulsive force sufficiently large to balance the attractive van der Waals and capillary forces for observable thicknesses of intergranular film are calculated and do not appear to be beyond possibility. However, it has yet to be established whether crystalline particles in a liquid-phase sintering medium possess an electrical double layer at high temperatures. If they do, such a surface charge layer may well have important consequences not only for liquid-phase sintering but also for high-frequency electrical properties and microwave sintering of ceramics containing a liquid phase.
引用
收藏
页码:1201 / 1204
页数:4
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