REAL-TIME SCANNING TUNNELLING MICROSCOPY OF SURFACES UNDER ACTIVE ELECTROCHEMICAL CONTROL

被引：20

作者：

ROBINSON, RS

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01419.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：541 / 546

页数：6

共 13 条

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[10] SCANNING ELECTROCHEMICAL AND TUNNELING ULTRAMICROELECTRODE MICROSCOPE FOR HIGH-RESOLUTION EXAMINATION OF ELECTRODE SURFACES IN SOLUTION [J].

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