SEEMAN-BOHLIN LINKAGE FOR SIEMENS X-RAY DIFFRACTOMETER

被引：2

作者：

BANERJEE, RL

RICHARD, A

机构：

[1] Department de mathématique, physique et informatique, Université de Moncton

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1991年 / 62卷 / 04期

关键词：

D O I：

10.1063/1.1142510

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A mechanical linkage attached to a Siemens x-ray diffractometer is designed and constructed to convert it to a Seeman-Bohlin diffractometer, with special emphasis on its suitability for x-ray characterization of polycrystalline thin films. The apparatus employs a pyrolitic graphite monochromator crystal using the full focusing Johansson principle for the diffracted beam to obtain a high intensity low background diffraction pattern. The performance of this Seeman-Bohlin diffractometer is illustrated by recording the diffraction pattern of a 100-Angstrom-thick thin film of gold.

引用

页码：986 / 988

页数：3

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