CALCULATION OF THE X-RAY-POWDER REFLECTION PROFILES OF VERY SMALL NEEDLE-LIKE CRYSTALS .1. PRINCIPLES OF THE METHOD

被引：12

作者：

YUCEL, A ^{[1
]}

RAUTUREAU, M ^{[1
]}

TCHOUBAR, D ^{[1
]}

TCHOUBAR, C ^{[1
]}

机构：

[1] UNIV ORLEANS,CRYSTALLOG LAB,CNRS,EQUIPE RECH 841,F-45045 ORLEANS,FRANCE

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1980年 / 13卷 / AUG期

关键词：

D O I：

10.1107/S0021889880012320

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：370 / 374

页数：5

共 11 条

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[2]

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[4] X- ray diffraction by finite and imperfect crystal lattices [J].

Ewald, PP .

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[5]

Guinier A., 1964, THEORIE TECHNIQUE RA, V3RD

[6] PROFILE ANALYSIS OF X-RAY POWDER DIFFRACTOMETER DATA - STRUCTURAL REFINEMENT OF LA0.75SR0.25CRO3 [J].

KHATTAK, CP ;

COX, DE .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (OCT1) :405-411

[7]

PONS CH, 1980, CLAY MINER, V15

[8]

RAUTUREAU M, 1976, J MICROSC SPECT ELEC, V1, P405

[9] METHOD OF PROFILE ANALYSIS OF PRODUCT BAND BY LEAFLET DIFFRACTANTS WITH AN ANISOMETRIC FORM [J].

ROUSSEAUX, F ;

TCHOUBAR, D .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (JUN1) :365-371

[10]

ROUSSEAUX F, 1975, THESIS U ORLEANS FRA

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