THICKNESS DEPENDENCE OF DEFECT DENSITY IN SILVER FILMS

被引：18

作者：

NARAYANDAS, K

RADHAKRISHNAN, M

BALASUBRAMANIAN, C

机构：

来源：

THIN SOLID FILMS | 1980年 / 67卷 / 02期

关键词：

D O I：

10.1016/0040-6090(80)90470-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：357 / 364

页数：8

共 25 条

[1]

CHANDHURI S, 1975, J PHYS D, V8, P1311

[2]

CHOPRA KL, 1969, THIN FILM PHENOMENA, P381

[3]

DAS VD, 1974, THIN SOLID FILMS, V24, P203

[4] The conductivity of thin metallic films according to the electron theory of metals [J].

Fuchs, K .

PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108

[5] THERMOELECTRIC POWER DUE TO SURFACE SCATTERING IN THIN GOLD FILMS [J].

LEONARD, WF ;

LIN, SF .

THIN SOLID FILMS, 1972, 11 (02) :273-&

[6] THERMOELECTRIC POWER OF THIN GOLD FILMS [J].

LIN, SF ;

LEONARD, WF .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (09) :3634-&

[7]

Maissel L.I., 1970, HDB THIN FILM TECHNO

[8] ELECTRICAL RESISTIVITY STUDY OF LATTICE DEFECTS INTRODUCED IN COPPER BY 1.25-MEV ELECTRON IRRADIATION AT 80-DEGREES-K [J].

MEECHAN, CJ ;

BRINKMAN, JA .

PHYSICAL REVIEW, 1956, 103 (05) :1193-1202

[9]

MOHAN S, 1974, SOLID STATE PHYS C, V17, P128

[10] ANNEALING STUDY OF ELECTRICAL-RESISTIVITY AND DEFECT DENSITY IN SILVER FILMS [J].

NARAYANDAS, K ;

RADHAKRISHNAN, M ;

BALASUBRAMANIAN, C .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1978, 48 (01) :K71-K74

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