COATING THICKNESS MEASUREMENT BY INTERFEROMETRY

被引：4

作者：

BECHTOLD, MF

机构：

来源：

关键词：

D O I：

10.1364/JOSA.37.000873

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：873 / 878

页数：6

共 9 条

[1]

BILLMEYER FW, 1947, PHYS REV, V71, P489

[2] THICKNESS MEASUREMENT OF THIN COATINGS BY X-RAY ABSORPTION [J].

FRIEDMAN, H ;

BIRKS, LS .

[3]

GUNN, 1946, NATURE, V158, P621

[4]

JENKINS, 1937, FUNDAMENTALS PHYSICA, P83

[5] The Brewsterian angle and refractive indices [J].

Pfund, AH .

[6] THE AGING OF GLASS SURFACES [J].

PFUND, AH .

[7]

PLESSNER, 1946, NATURE, V158, P915

[8]

STRAUB HW, 1943, ALIEN PROPERTY CUSTO, P220

[9]

WOOD RW, 1934, PHYS OPTICS, P192