LASER-EXAFS - FAST EXTENDED X-RAY ABSORPTION FINE-STRUCTURE SPECTROSCOPY WITH A SINGLE PULSE OF LASER-PRODUCED X-RAYS

被引：32

作者：

MALLOZZI, PJ

SCHWERZEL, RE

EPSTEIN, HM

CAMPBELL, BE

机构：

[1] Battelle, Columbus Laboratories, Columbus

来源：

SCIENCE | 1979年 / 206卷 / 4416期

关键词：

D O I：

10.1126/science.206.4416.353

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

The extended x-ray absorption fine structure (EXAFS) spectrum of aluminum has been measured with a nanosecond pulse of soft x-rays generated by a laser-produced plasma. This technique provides a practical alternative to synchrotron radiation for the acquisition of EXAFS data. It also provides a unique capability for the analysis of molecular structure in highly transient chemical species. Copyright © 1979 AAAS.

引用

页码：353 / 355

页数：3

共 18 条

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