PHOTOAMPERIC PROBES IN SCANNING-TUNNELING-MICROSCOPY

被引：30

作者：

PRINS, MWJ

VANDERWIELEN, MCMM

JANSEN, R

ABRAHAM, DL

VANKEMPEN, H

机构：

[1] Research Institute for Materials, University of Nijmegen, Toernooiveld

来源：

APPLIED PHYSICS LETTERS | 1994年 / 64卷 / 10期

关键词：

D O I：

10.1063/1.110891

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The charge generated at the apex of a semiconductor tip upon laser irradiation is utilized in a scanning tunneling microscope. We show such arrangements can produce photoinduced tunnel currents of several hundred picoamperes, sufficient for stable STM operation and sensitive enough to detect nanowatt variations in the incident optical power.

引用

页码：1207 / 1209

页数：3

共 13 条

[1] PHOTOASSISTED TUNNELING SPECTROSCOPY - PRELIMINARY-RESULTS ON TUNGSTEN DISELENIDE
AKARI, S
LUXSTEINER, MC
VOGT, M
STACHEL, M
DRANSFELD, K
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 561 - 563
[2] CALCULATED PHOTOCURRENTS AND SURFACE-BARRIER HEIGHTS
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PALERMO, A
WEAVER, JH
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CAHILL, DG
HAMERS, RJ
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 564 - 567
[4] NANOSCALE PHOTOVOLTAIC IMAGING USING THE SCANNING TUNNELING MICROSCOPE
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SNOW, ES
MARRIAN, CRK
PROKES, SM
KATZER, DS
[J]. ULTRAMICROSCOPY, 1992, 42 : 764 - 770
[5] ATOMICALLY RESOLVED CARRIER RECOMBINATION AT SI(111)-(7X7) SURFACES
HAMERS, RJ
MARKERT, K
[J]. PHYSICAL REVIEW LETTERS, 1990, 64 (09) : 1051 - 1054
[6] PHOTOVOLTAIC EFFECTS IN PHOTOEMISSION-STUDIES OF SCHOTTKY-BARRIER FORMATION
HECHT, MH
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (04): : 1018 - 1024
[7] JANSEN R, IN PRESS J VAC SCI T
[8] OPTICAL INTERACTIONS IN THE JUNCTION OF A SCANNING TUNNELING MICROSCOPE
KUK, Y
BECKER, RS
SILVERMAN, PJ
KOCHANSKI, GP
[J]. PHYSICAL REVIEW LETTERS, 1990, 65 (04) : 456 - 459
[9] ELECTROSTATIC SAMPLE-TIP INTERACTIONS IN THE SCANNING TUNNELING MICROSCOPE
MCELLISTREM, M
HAASE, G
CHEN, D
HAMERS, RJ
[J]. PHYSICAL REVIEW LETTERS, 1993, 70 (16) : 2471 - 2474
[10] PRINS MWJ, UNPUB

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