共 20 条
[1]
MACH-ZEHNDER INTERFEROMETER FOR MEASUREMENT OF COMPLEX PERMITTIVITY OF LOSSY DIELECTRICS AT SUBMILLIMETRE WAVELENGTHS
[J].
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS,
1971, 4 (10)
:730-+
[2]
[Anonymous], 1982, PHYS ED
[5]
Clausius R, 1879, DIE MECH UGMETEORIE, V2, P62
[6]
DETERMINATION OF DIELECTRIC PERMITTIVITY AND THICKNESS OF A METAL LAYER FROM A SURFACE-PLASMON RESONANCE EXPERIMENT
[J].
APPLIED OPTICS,
1990, 29 (13)
:1974-1978
[8]
ELKASHEF H, IN PRESS APPL OPT
[9]
REFRACTIVE-INDEX OF LIQUID SOLUTIONS AT LOW-TEMPERATURES - ACCURATE MEASUREMENT
[J].
APPLIED OPTICS,
1976, 15 (04)
:858-859
[10]
Guenther RD., 1990, MODERN OPTICS