OPTICAL AND ELECTRICAL-PROPERTIES OF MATERIALS

被引:37
作者
ELKASHEF, H
机构
[1] Physics Department, Faculty of Science, Tanta University
关键词
D O I
10.1063/1.1144812
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An interferometric technique using a newly developed Mach-Zehnder interferometer is applied to measure the refractive indices of light transmitting fluids in general. It has been particularly used for determining the refractive indices and its variation with temperature for two solvents of laser dyes (toluene and carbon disulphide). Accuracy of 1 x 10(-5) is achieved where no uncertainity of the measurements arising from the naked eye estimation. The obtained optical results have been used to calculate a number of different physical parameters such as the optical permittivity (or dielectric susceptibility), thermal coefficient of refractive index, temperature coefficient of permittivity, specific refraction, molar refraction, polarizability, radius of the molecule, relaxation time, temperature coefficient of volume expansion, characteristic impedance of matter, and the constant electric moment of a molecule. It is shown that the experimental results agree well with the calculated ones. The advantages of this technique and the sensitivity of the instrument are discussed.
引用
收藏
页码:2056 / 2061
页数:6
相关论文
共 20 条
[1]   MACH-ZEHNDER INTERFEROMETER FOR MEASUREMENT OF COMPLEX PERMITTIVITY OF LOSSY DIELECTRICS AT SUBMILLIMETRE WAVELENGTHS [J].
ALLNUTT, JE ;
STANIFORTH, JA .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (10) :730-+
[2]  
[Anonymous], 1982, PHYS ED
[3]   INTERFEROMETRIC MEASUREMENT OF REFRACTIVE-INDEXES [J].
BETZLER, K ;
GRONE, A ;
SCHMIDT, N ;
VOIGT, P .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (04) :652-653
[4]   SIMPLE AUTOMATIC FRINGE COUNTER FOR INTERFEROMETRIC MEASUREMENT OF INDEX OF REFRACTION OF GASES [J].
BLATT, JH ;
POLLARD, P ;
SANDILANDS, S .
AMERICAN JOURNAL OF PHYSICS, 1974, 42 (11) :1029-1030
[5]  
Clausius R, 1879, DIE MECH UGMETEORIE, V2, P62
[6]   DETERMINATION OF DIELECTRIC PERMITTIVITY AND THICKNESS OF A METAL LAYER FROM A SURFACE-PLASMON RESONANCE EXPERIMENT [J].
DEBRUIJN, HE ;
KOOYMAN, RPH ;
GREVE, J .
APPLIED OPTICS, 1990, 29 (13) :1974-1978
[7]   NEW DEVELOPMENT OF MACH-ZEHNDER INTERFEROMETER FOR LASER FREQUENCY SELECTION AND TUNING [J].
ELKASHEF, H ;
HASSAN, GE .
JOURNAL OF MODERN OPTICS, 1992, 39 (01) :43-47
[8]  
ELKASHEF H, IN PRESS APPL OPT
[9]   REFRACTIVE-INDEX OF LIQUID SOLUTIONS AT LOW-TEMPERATURES - ACCURATE MEASUREMENT [J].
GRANGE, BW ;
STEVENSON, WH ;
VISKANTA, R .
APPLIED OPTICS, 1976, 15 (04) :858-859
[10]  
Guenther RD., 1990, MODERN OPTICS