METAL ELECTROREFLECTANCE MEASUREMENTS ON MIM STRUCTURES - THEORETICAL AND EXPERIMENTAL RESULTS

被引:2
作者
CHABRIER, G
GOUDONNET, JP
NIQUET, G
VERNIER, P
机构
关键词
D O I
10.1016/0040-6090(82)90651-4
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:203 / 207
页数:5
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共 7 条
  • [1] MEASUREMENT OF METAL ELECTROREFLECTANCE IN MIM STRUCTURES
    CHABRIER, G
    GOUDONNET, JP
    NIQUET, G
    PAUTY, M
    VERNIER, P
    [J]. THIN SOLID FILMS, 1981, 82 (01) : 89 - 95
  • [2] CHABRIER G, 1980, OPT COMMUN, V32, P105
  • [3] GARRIGOS R, 1974, THESIS NICE
  • [4] OPTICAL-CONSTANTS OF THIN EVAPORATED-FILMS OF CADMIUM AND ZINC SULFIDES
    KHAWAJA, E
    TOMLIN, SG
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (05) : 581 - 594
  • [5] EXPERIMENTAL AND THEORETICAL STUDY OF GOLD ELECTROREFLECTANCE AT OBLIQUE-INCIDENCE
    KOFMAN, R
    GARRIGOS, R
    CHEYSSAC, P
    [J]. SURFACE SCIENCE, 1974, 44 (01) : 170 - 184
  • [6] ELECTROREFLECTANCE SPECTRA OF AG(III) ELECTRODES
    KOLB, DM
    KOTZ, R
    [J]. SURFACE SCIENCE, 1977, 64 (01) : 96 - 108
  • [7] ELECTRON-EMISSION MECHANISM IN MIM STRUCTURES AND ELECTRON PROPAGATION IN METALS
    NIQUET, G
    FLAMION, PJ
    VERNIER, P
    [J]. THIN SOLID FILMS, 1977, 44 (01) : 103 - 108