CURRENT EXCITED LARGE-SIGNAL ANALYSIS OF IMPATT DEVICES AND ITS CIRCUIT IMPLICATIONS

被引：15

作者：

GUPTA, M ^{[1
]}

LOMAX, RJ ^{[1
]}

机构：

[1] UNIV MICHIGAN,DEPT ELECTR & COMP ENGN,ELECTR PHYS LAB,ANN ARBOR,MI 48104

来源：

关键词：

D O I：

10.1109/T-ED.1973.17661

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：395 / 399

页数：5

共 9 条

ALEXANDER, JW .

[2]

BRACKETT CA, 1971, IEEE T ELECTRON DEVI, VED18, P147

[3]

EVANS WJ, 1969, IEEE T MICROWAVE THE, VMT17, P1060

[4]

EVANS WJ, 1968, IEEE T ELECTRON DEV, VED15, P708

[5]

GUPTA MS, 1971, IEEE T ELECTRON DEVI, VED18, P544

KUROKAWA, K .

BELL SYSTEM TECHNICAL JOURNAL, 1969, 48 (06) :1937-+

[7]

SCHROEDER WE, 1970, IEEE T, VMT18, P327

SELLBERG, F .

SWAN, CB .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1968, 56 (09) :1616-&