SIMPLE HIGH-PRECISION METHOD FOR MEASURING THE SPECULAR REFLECTANCE OF OPTICAL-COMPONENTS

被引：8

作者：

VOSS, A

PLASS, W

GIESEN, A

机构：

[1] Institut für Strahlwerkzeuge, Universität Stuttgart, Stuttgart, D-70569

来源：

APPLIED OPTICS | 1994年 / 33卷 / 36期

关键词：

D O I：

10.1364/AO.33.008370

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a simple method to determine precisely the specular reflectance of optical components. The absence of transmissive elements in this method makes a wide spectral range available. High accuracy and precision are achieved with a fast, periodic change between the reference beam and the probe beam. Special efforts were made to eliminate inhomogeneities of beam intensity and detector sensitivity. With our experimental setup we obtain a precision of +/-3 x 10(-4) at the wavelength of 10.6 mu m and +/-3 x 10(-5) at 1.06 mu m for a single-bounce-measuring setup.

引用

页码：8370 / 8374

页数：5

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