EXCESS NOISE IN DC SQUIDS FROM 4.2K TO 0.022K

被引：29

作者：

WELLSTOOD, FC ^{[1
]}

URBINA, C ^{[1
]}

CLARKE, J ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DIV MAT & MOLEC RES,BERKELEY,CA 94720

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1987年 / 23卷 / 02期

关键词：

D O I：

10.1109/TMAG.1987.1065021

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1662 / 1665

页数：4

共 11 条

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[8] PARAMETER FLUCTUATIONS AND LOW-FREQUENCY NOISE IN JOSEPHSON JUNCTION DEVICES [J].

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[10] LOW-FREQUENCY NOISE AND DISCRETE CHARGE TRAPPING IN SMALL-AREA TUNNEL JUNCTION DC SQUIDS [J].

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