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EXPERIMENTAL-STUDY OF SYMMETRIC MICROSTRIP BENDS AND THEIR COMPENSATION

被引：74
作者：
DOUVILLE, RJP
JAMES, DS
机构：
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1978年 / 26卷 / 03期
关键词：
D O I：
10.1109/TMTT.1978.1129340
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：175 / 182
页数：8
相关论文
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