PHOTO-VOLTAIC PROPERTIES OF REACTIVELY SPUTTERED A-SIHX FILMS

被引:23
作者
MOUSTAKAS, TD
WRONSKI, CR
MOREL, DL
机构
关键词
D O I
10.1016/0022-3093(80)90288-4
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:719 / 724
页数:6
相关论文
共 11 条
[1]   HYDROGENATION AND THE DENSITY OF DEFECT STATES IN AMORPHOUS SILICON [J].
BRODSKY, MH ;
KAPLAN, D .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 32 (1-3) :431-435
[2]  
Carlson D. E., 1976, Twelfth IEEE Photovoltaic Specialists Conference 1976, P893
[3]   EVIDENCE FOR SHARP AND GRADUAL OPTICAL-ABSORPTION EDGES IN AMORPHOUS GERMANIUM - COMMENT [J].
CONNELL, GAN ;
LEWIS, A .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1973, 60 (01) :291-298
[4]   USE OF HYDROGENATION IN STRUCTURAL AND ELECTRONIC STUDIES OF GAP STATES IN AMORPHOUS-GERMANIUM [J].
CONNELL, GAN ;
PAWLIK, JR .
PHYSICAL REVIEW B, 1976, 13 (02) :787-804
[5]  
DENEUFVILLE JP, 1980, J NON-CRYST, V35
[6]  
FRITZSCHE H, 1978, SOLID STATE TECHNOL, V21, P55
[7]   DEFECTS IN PLASMA-DEPOSITED A-SI-H [J].
KNIGHTS, JC ;
LUCOVSKY, G ;
NEMANICH, RJ .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 32 (1-3) :393-403
[8]  
MOTT NF, 1971, ELECTRONIC PROCESSES
[9]   SPUTTERED HYDROGENATED AMORPHOUS SILICON [J].
MOUSTAKAS, TD .
JOURNAL OF ELECTRONIC MATERIALS, 1979, 8 (03) :391-435
[10]   DOPING, SCHOTTKY-BARRIER AND P-N-JUNCTION FORMATION IN AMORPHOUS-GERMANIUM AND SILICON BY RF SPUTTERING [J].
PAUL, W ;
LEWIS, AJ ;
CONNELL, GAN ;
MOUSTAKAS, TD .
SOLID STATE COMMUNICATIONS, 1976, 20 (10) :969-972