CHARACTERIZATION AND COMPARISON OF MICROSTRUCTURES IN THE SHAPED-CHARGE REGIME - COPPER AND TANTALUM

被引:42
作者
GUREVITCH, AC [1 ]
MURR, LE [1 ]
SHIH, HK [1 ]
NIOU, CS [1 ]
ADVANI, AH [1 ]
MANUEL, D [1 ]
ZERNOW, L [1 ]
机构
[1] ZERNOW TECH SERV INC,SAN DIMAS,CA 91773
关键词
Light microscopy - Shaped charge regime;
D O I
10.1016/1044-5803(93)90022-N
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Light microscopy, scanning electron microscopy, and transmission electron microscopy techniques were employed, along with a novel technique for building up small, recovered jet fragments using electrodeposition of copper, to examine specific segments of fabricated shaped charge liner cones and corresponding, residual jet fragments. Oxygen-free electronic copper and tantalum shaped charge regimes (liner cones and recovered jet fragments) were compared, and a reduction in the average grain size of recovered jet fragments as compared to the starting liner cones was a consistent observation. The average grain sizes for all cones was 35mum, and the maximum grain reduction occurred for an annealed, equiaxed tantalum cone, which resulted in a residual jet fragment grain size between 1 and 5mum. This is indicative of dynamic recrystallization during jet elongation and microstructure evolution.
引用
收藏
页码:201 / 216
页数:16
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