PRESENT PROBLEMS AND FUTURE OPPORTUNITIES IN PRECISE INTENSITY MEASUREMENTS WITH SINGLE-CRYSTAL X-RAY DIFFRACTOMETERS

被引：15

作者：

YOUNG, RA

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY | 1969年 / A 25卷

关键词：

D O I：

10.1107/S0567739469000076

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

[No abstract available]

引用

页码：55 / +

页数：1

共 48 条

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