Quantitative spectrochemical analysis - Chemical and metallurgical applications

被引：7

作者：

Owens, JS ^{[1
]}

机构：

[1] Dow Chem Co, X Ray & Spect Dept, Midland, MI USA

来源：

INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION | 1938年 / 10卷

关键词：

D O I：

10.1021/ac50118a005

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：0064 / 0067

页数：4

共 13 条

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[2]

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[3]

DUFFENDACK OS, IN PRESS

Gerlach, W .

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[5] Intensity marks on photographic plates [J].

Hansen, G .

ZEITSCHRIFT FUR PHYSIK, 1924, 29 :356-359

Mannkopff, R. ;

Peters, Cl. .

ZEITSCHRIFT FUR PHYSIK, 1931, 70 (7-8) :444-453

[7]

OWENS JS, 1938, METALS ALLOYS, V9, P15

[8]

OWENS JS, 1935, P AM SOC TESTING M 2, V35, P61

[9]

SCHEIBE G, 1928, Z ANGEW CHEM, V41, P1218

[10]

STROCK LW, 1936, SPECTRUM ANAL CARBON