ANALYTICAL APPLICATIONS OF X-RAY EXCITED OPTICAL FLUORESCENCE SPECTRA - INTERNAL STANDARD PRINCIPLE

被引:33
作者
DEKALB, EL
FASSEL, VA
TANIGUCH.T
SARANATH.TR
机构
[1] Institute for Atomic Research, Department of Chemistry, Iowa State University, Ames
[2] Asahi Chemical Industry Co., Ltd., Tokyo
[3] B.A.R.C., Bombay-74, Trombay
关键词
D O I
10.1021/ac50158a024
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The intensities of X-ray-induced optical fluorescence emitted by trace concentrations of various rare earth elements in a suitable matrix are shown to be enhanced by low concentrations of residual impurities, and to be suppressed by somewhat higher concentrations of the same impurities. A variety of other operational variables, such as the time and temperature course of the sample ignition, the degree of absorption of H2O and CO2, and drifts ín power output of the X-ray tube and in the detector response sensitivity, can also influence the fluorescence intensities. It is shown that the use of an internal standard will satisfactorily compensate for many of these effects. © 1968, American Chemical Society. All rights reserved.
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页码:2082 / &
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