SYMMETRY IN LOW-ENERGY-POLARIZED-ELECTRON DIFFRACTION

被引：49

作者：

WANG, GC

DUNLAP, BI

CELOTTA, RJ

PIERCE, DT

机构：

[1] National Bureau of Standards, Washington

来源：

PHYSICAL REVIEW LETTERS | 1979年 / 42卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.42.1349

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The first low-energy-electron-diffraction measurements using a polarized incident electron beam are reported and compared to measurements where an unpolarized incident beam is analyzed after scattering. Whereas, because of multiple scattering, equivalence of the two measurements is not expected in general, excellent agreement is obtained for specular scattering in the (010) plane from W(100). A theoretical argument is presented for the case where the scattering plane is a mirror-symmetry plane of the crystal. © 1979 The American Physical Society.

引用

页码：1349 / 1352

页数：4

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