THE ELECTRICAL-ACTIVITY OF STACKING-FAULTS IN CZOCHRALSKI SILICON

被引：3

作者：

CASTALDINI, A ^{[1
]}

CAVALLINI, A ^{[1
]}

POGGI, A ^{[1
]}

SUSI, E ^{[1
]}

机构：

[1] CNR,LAMEL INST,I-40126 BOLOGNA,ITALY

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1989年 / 48卷 / 05期

关键词：

D O I：

10.1007/BF00619714

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：431 / 436

页数：6

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