CHARACTERIZATION OF SIO USING FINE FEATURES OF X-RAY K EMISSION SPECTRA

[1] BEYNON J, 1970, VACUUM, V20, P293

[2] MENDEL H, 1967, KONINKL NED AKAD V B, V70, P276

[3] ORIGIN AND INTENSITIES OF LOW ENERGY SATELLITE LINES IN X-RAY EMISSION SPECTRA - A MOLECULAR ORBITAL INTERPRETATION [J]. JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1970, 3 (06): : 1275 - &

[4] SILICON VALENCE IN SIO FILMS STUDIED BY X-RAY EMISSION [J]. SOLID STATE COMMUNICATIONS, 1964, 2 (06) : 151 - 152

[1] BEYNON J, 1970, VACUUM, V20, P293

[2] MENDEL H, 1967, KONINKL NED AKAD V B, V70, P276

[3] ORIGIN AND INTENSITIES OF LOW ENERGY SATELLITE LINES IN X-RAY EMISSION SPECTRA - A MOLECULAR ORBITAL INTERPRETATION [J]. JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1970, 3 (06): : 1275 - &

[4] SILICON VALENCE IN SIO FILMS STUDIED BY X-RAY EMISSION [J]. SOLID STATE COMMUNICATIONS, 1964, 2 (06) : 151 - 152