COMPLEX DIELECTRIC-CONSTANT MEASUREMENT OF SAMPLES OF VARIOUS CROSS-SECTIONS USING A MICROWAVE IMPEDANCE BRIDGE

被引：5

作者：

JOO, J ^{[1
]}

EPSTEIN, AJ ^{[1
]}

机构：

[1] OHIO STATE UNIV,DEPT CHEM,COLUMBUS,OH 43210

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1994年 / 65卷 / 08期

关键词：

D O I：

10.1063/1.1144665

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A microwave impedance bridge covering from 8.2 to 12.4 GHz used for measuring complex dielectric constants over a wide temperature range is described. This apparatus is suited for materials formed into solid posts having different cross sections. The effective diameters for use in the analysis of circular, elliptical, or rectangular cross-section posts are presented. The effective diameters are applied to determine the complex dielectric constant of rectangular-shaped conducting polymer film. The frequency and temperature dependence of the dielectric constant and conductivity are presented, and compared with those obtained using a microwave cavity perturbation technique at 6.5 GHz. The bridge results are well suited for independent determination of the depolarization factor of a rectangular post for use in analysis of results of the cavity perturbation method.

引用

页码：2653 / 2657

页数：5

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